DETERMINATION OF CRYSTALLITE SIZE AND STRAIN FROM THE ANALYSIS OF X-RAY DIFFRACTION LINE BROADENING
J. M. H. Jaber and N. N. Rammo*
Baghdad University - College of Science. Physics Department.
*AL-Raya Company. Baghdad-Iraq.
The Fourier method has been utilized to analyze broadened x- ray lines due to size and strain of a nickel electro deposited on a brass substrate. The size of crystallites are found to be nearly isotropic in the directions fill] and  where as strain is greater in  than in  directions.