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Physics: DETERMINATION OF CRYSTALLITE SIZE AND STRAIN FROM THE ANALYSIS OF X-RAY DIFFRACTION LINE BROADENING

 

DETERMINATION OF CRYSTALLITE SIZE AND STRAIN FROM THE ANALYSIS OF X-RAY DIFFRACTION LINE BROADENING

J. M. H. Jaber and N. N. Rammo*

Baghdad University - College of Science. Physics Department.

Baghdad -Iraq.

*AL-Raya Company. Baghdad-Iraq.

ABSTRACT

The Fourier method has been utilized to analyze broadened x- ray lines due to size and strain of a nickel electro deposited on a brass substrate. The size of crystallites are found to be nearly isotropic in the directions fill] and [200] where as strain is greater in [200] than in [111] directions.


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